Low-frequency noise in AlN/AlGaN/GaN metal-insulator-semiconductor devices: A comparison with Schottky devices
Low-frequency noise in AlN/AlGaN/GaN metal-insulator-semiconductor devices: A comparison with Schottky devices
Nơi đăng:
Journal of Applied Physics,
Số: 116,
Trang: 054510-1--054510-8,
Năm: 2014,
Loại bài viết: Bài báo,
Quốc gia: United States.