Low-frequency noise in AlN/AlGaN/GaN metal-insulator-semiconductor devices: A comparison with Schottky devices

Low-frequency noise in AlN/AlGaN/GaN metal-insulator-semiconductor devices: A comparison with Schottky devices
Nơi đăng: Journal of Applied Physics, Số: 116, Trang: 054510-1--054510-8, Năm: 2014, Loại bài viết: Bài báo, Quốc gia: United States.