Fabrication and characterization of BN/AlGaN/GaN metal-insulator-semiconductor heterojunction field-effect transistors with sputtering-deposited BN gate dielectric
Fabrication and characterization of BN/AlGaN/GaN metal-insulator-semiconductor heterojunction field-effect transistors with sputtering-deposited BN gate dielectric
Nơi đăng:
Phys Status Solidi C,
Số: 10,
Trang: 1401-1404,
Năm: 2013,
Loại bài viết: Bài báo,
Quốc gia: United States.