Fabrication and characterization of BN/AlGaN/GaN metal-insulator-semiconductor heterojunction field-effect transistors with sputtering-deposited BN gate dielectric

Fabrication and characterization of BN/AlGaN/GaN metal-insulator-semiconductor heterojunction field-effect transistors with sputtering-deposited BN gate dielectric
Nơi đăng: Phys Status Solidi C, Số: 10, Trang: 1401-1404, Năm: 2013, Loại bài viết: Bài báo, Quốc gia: United States.